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Technical Article

Differences Between Run-In and Burn-In Tests

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In the electronic components’ industry, it’s crucial to carry out tests that ensure the reliability and durability of the products before they’re delivered to the customer.

Among the various stages that guarantee the quality of components and equipment, Run-In and Burn-In tests are essential procedures across different industries.

Both tests focus on the operation of the tested devices under controlled conditions. However, their methods and objectives are different.

In this article, we explain the differences between Run-In and Burn-In tests and how each is applied in an electronic component manufacturing facility.

Run-In Tests

The main goal of Run-In tests is to identify early failures or manufacturing defects that might appear during the initial period of operation of the components or the systems in which they are integrated.

These tests involve operating the equipment or component under typical usage conditions, generally within the normal temperature and voltage range expected in the real application, without exposing the product to extreme conditions.

During Run-In, electronic components and devices are powered and may be subjected to temperature and power cycles, simulating the usage environment specified by the manufacturer.

These tests, essential for verifying equipment performance, are carried out in a controlled production environment, typically on test benches.

Additionally, they are a crucial step to ensure that products function correctly in their normal application environment and to reduce the risk of returns and poor performance.

Any necessary adjustments identified are usually made at calibration and functional testing stations.

Burn-In Tests

Burn-In tests stand out for accelerating the aging and wear of products by subjecting them to extreme conditions over a defined period.

Exposing electronic components to voltage, temperature, or power cycles above specified levels, in the short term, provides insight into how these components behave under stress, though it doesn’t replace full lifecycle tests for durability forecasting.

These tests aim to trigger latent faults and, in practice, eliminate potentially defective components that could cause problems in the field.

Therefore, they are excellent for preventing the “infant mortality” phenomenon in electronic equipment such as control units, sensors, and power modules

Devices are placed in special chambers and exposed to cycles of extreme conditions that may last several hours. This way, manufacturers ensure only the most robust elements reach the market.

In the case of critical application solutions, it’s common to test 100% of the components manufactured in a specific batch, ensuring all the reliability demanded by customers.

These tests can be static or dynamic. In static tests, high temperature and voltage are applied without functional operation of the component. For dynamic tests, the equipment and devices must be operating normally or simulating real operations.

Key Differences

Just as important as understanding how Run-In and Burn-In tests work is recognizing the key differences between them.

Below, we provide a table that outlines these differences

Industry Standards for Run-In and Burn-In Testing

To ensure consistency and reliability, Burn-In and Run-In protocols implemented by companies must comply with industry standards.

Some of the most commonly referenced standards include ISO 16750, which provides guidelines for environmental testing of automotive electrical and electronic equipment; AEC-Q100 and AEC-Q200, which define reliability testing criteria for automotive electronic components.

ISO 7637 sets procedures for testing electrical disturbances in vehicles, while SAE J1455 defines environmental and reliability testing standards for heavy-duty electronic equipment.

Additionally, IEC 60068 covers a wide range of environmental testing methods, including temperature, humidity, vibration, and shock tests.

Regarding diagnostic communication protocols for automotive equipment, ISO-14229 (Unified Diagnostic Services) and ISO 15765-2 are also notable.

Many equipment manufacturers (OEMs) also impose their own testing requirements to ensure that specific performance and reliability standards are met.

Are Your Components Ready for Critical Applications?

With a crucial role in various industries, such as automotive, consumer electronics, and industrial electronics, the test categories explored here apply to many types of products.

The Run-In and Burn-In test systems developed by Selmatron meet the needs of different applications, complying with their requirements and ensuring greater reliability in manufacturing and development processes.

With our solutions, companies have precise and safe ways to test the properties and functions of their electronic components.

Only then is it possible to ensure the continuous improvement of the products delivered to end customers and to stay at the forefront of technology, with quality and performance as absolute priorities.

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